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ETS 2020 Highlights - DAY 4

Today's special highlight is the Embedded Tutorial - "Device-Aware Test for Emerging Memories: Enabling your test program for DPPB level" by Said Hamdioui.

This tutorial introduces a new test approach: device aware test (DAT) for emerging memory technologies such as MRAM, RRAM, and PCM. The DAT approach enables accurate models of device defects to obtain realistic fault models, which are used to develop high-quality and optimized test solutions. This is demonstrated by an application of DAT to pinhole defects in STT-MRAMs and forming defects in RRAMs.

Said Hamdioui is the Chair Professor on Dependable and Emerging Computer Technologies, Head of the Computer Engineering Laboratory, and also serving as Head of the Quantum and Computer Engineering department of the Delft University of Technology, the Netherlands.

It is not too late to get your 50 EUR entrance ticket to the the complete ETS'2020 program! It will be kept available until Jun 7th.

Click HERE to register!